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Emission Test Report .1VI 'VGA-208 Section 3 Revision: 0 - Date: September 30, 1999 Page 3 of 33 of non-simultaneous testing is that results obtained from the inlet during Run 4 are somewhat larger than the outlet results. • During the last two runs of regular testing (Runs 8 and 9),no M26A trains were used for sample collection at the outlet in order to conserve usable water-cooled probes. Particulate matter for these runs was collected on the metals train. Particulate matter results were not compromised by using a different train sample collection, however, no HC1 samples could be collected as a result. Some trains at the scrubber inlet location (Run 1 M.26A train Run 2 M29 train Run 2 M23 train Run 3 M.26 A train and Run 5 M23 train) did not pass final leak check from the nozzle, but did pass from the sample transfer line. This appeared to be caused by extreme temperatures loosening the nozzle-to-probe liner connection. Since 02, CO„ and moisture results were nearly identical for all 2 Y trains within a given run, results from these trains appear to be uncompromised a and representative of stack conditions. The PCDDIPCDF outlet trains for Runs 5 and 10 did not pass final leak check. These results are considered to be unusable and are therefore not reported. Thermocouples During Run 1, the probe thermocouple on the PCDDIPCDF train at the scrubber inlet location shorted out. This was replaced after the end of the run with the result that no probe temperature data was available for the second half of the run. However, based on �r x:. stack temperature and filter box temperature, this is not expected to have affected results. During Run 3, the XAD thermocouple on the PCDDIPCDF train started to fail, giving '::.:.. high temperature readings in spite of frequent applications of ice. It was replaced during port change and readings thereafter were well within method requirements. Data were not temperatures affected, since the high temperature readings were not a reflection of actual tem ..... g p g p thought to have been experienced at the XAD inlet. f Sample Recovery The recovery and QA rinses of the Run 1 PCDDIPCDF inlet and outlet sampling trains were not collected according to the test plan (see analysismemo in Appendix A). The recovery rinses for the semivolatile front-half (PMD/F4MF FH) filet were inadvertently placed into the SV FH inlet sample bottles. This was easily corrected by analyzing the recovery rinses labeled for the inlet with the outlet train samples and designating a new number for the inlet train rinses to prevent mix up during analysis. The r QA rinse from the PCDDIPCDF front-half outlet was inadvertently laced into the inlet MM-AMaa931-09-03 Slwo L